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Author: J. V. Conway


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Reference
R. Kieffer et al., “Development of a Versatile OTR-ODR Station for Future Linear Colliders”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 461-464.
S. M. Pattalwar et al., “Integration, Commissioning and Cryogenics Performance of the ERL Cryomodule Installed on ALICE-ERL Facility at STFC Daresbury Laboratory, UK”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper MOP086, pp. 349-352.
S. Mazzoni et al., “Recent Results on Non-invasive Beam Size Measurement Methods Based on Polarization Currents”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 464-467.
S. Wang et al., “Horizontal Beam-size Measurements at CESR-TA Using Synchrotron-light Interferometer”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper MOPPR079, pp. 972-974.
T. Lef?¿vre et al., “Cherenkov Diffraction Radiation as a tool for beam diagnostics”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 660-664.
T. Lefevre et al., “Cherenkov Diffraction Radiation From Long Dielectric Material: An Intense Source of Photons in the NIR-THz Range”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 400-403.
T. Lefevre et al., “Non-invasive Beam Diagnostics with Cherenkov Diffraction Radiation”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2005-2008.
W. Hartung et al., “Measurements of Secondary Electron Yield of Metal Surfaces and Films with Exposure to a Realistic Accelerator Environment”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper THPFI087, pp. 3493-3495.
Y. Li et al., “In-situ Secondary Electron Yield Measurement System at CesrTA”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper TUP230, pp. 1253-1255.
Y. Li, J. V. Conway, X. Liu, and M. A. Palmer, “Electron Cloud Diagnostic Chambers with Various EC-suppression Coatings”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper THPFI088, pp. 3496-3498.


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