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C. H. Shim et al., “Simulation studies for attosecond soft X-ray FEL pulse generation at PAL-XFEL”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper TUPL063, pp. 1899-1901. |
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C. H. Shim et al., “Two-color FEL pulse generation at PAL-XFEL”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEAD1, this conference. |
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C. Kim et al., “Diagnostic Systems for the PAL-XFEL Commissioning”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 11-13. |
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C. Kim et al., “Diagnostic Systems of the PAL-XFEL”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2091-2094. |
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C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 404-406. |
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C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Monitor for Microbunching Instability in X-ray Free Electron Laser”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper TUPP27, unpublished. |
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D. C. Shin, H.-S. Kang, G. Kim, C.-K. Min, and G. Mun, “Development of the RF Phase Shifter with Femtosecond Time Delay Resolution for the PAL-XFEL Laser System”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper TUP021, pp. 222-225. |
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D. C. Shin, J. H. Hong, H.-S. Kang, C. Kim, G. Kim, and C.-K. Min, “Development of BAM Electronics in PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 400-403. |
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G. Kim, D. May, P. McIntyre, and A. Sattarov, “A Superconduction Isochronous Cyclotron Stack as a Driver for a Thorium-Cycle Power Reactor”, in Proc. 16th Int. Conf. on Cyclotrons and Their Applications (Cyclotrons'01), East Lansing, MI, USA, May 2001, paper L-5, pp. XX-XX. |
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G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447. |
