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7th Int. Beam Instrumentation Conf. (IBIC'18)

Shanghai, China, Sep. 2018

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	Reference
	J. Yan, T. L. Allison, S. Bruhwel, and W. Lu, “Signal Processing for Beam Loss Monitor System at Jefferson Lab”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 245-248.
	J. Zink, M. K. Czwalinna, M. Fenner, S. Jab, J. Marjanovic, and H. Schlarb, “High-Speed Direct Sampling FMC for Beam Diagnostic and Accelerator Protection Applications”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 534-537.
	K. B. Scheidt, “Complete Test Results of New BPM Electronics for the ESRF New LE-Ring”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 257-260.
	K. Nakayoshi, Y. Fujii, T. Nakadaira, and K. Sakashita, “Development of an Expert System for the High Intensity Neutrino Beam Facility at J-PARC”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 154-158.
	K. Sakashita, M. L. Friend, Y. Koshio, K. Nakayoshi, and S. Yamasu, “Upgrade of the Machine Protection System Toward 1.3 MW Operation of the J-PARC Neutrino Beamline”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 18-21.
	L. Adler et al., “Synchrotron Emittance Analysis Procedure at MedAustron”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 490-493.
	L. Bobb and G. Rehm, “Performance of a Reflective Microscope Objective in an X-ray Pinhole Camera”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 477-481.
	L. C. Cao et al., “The Design of Scanning Control System for Proton Therapy Facility at CIAE”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 319-321.
	L. E. J??rgensen et al., “High-Energy Scraper System for the S-DALINAC Extraction Beam Line - Commissioning Run”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 75-77.
	L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 448-450.

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