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[n]	D. R. Bett et al., “A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 1382-1385. doi:10.18429/JACoW-IPAC2021-TUPAB020

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