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[n]	P. I. Volz, S. Grimmer, M. Huck, and A. Meseck, “Goubau-Line Set Up for Bench Testing Impedance of IVUE32 Components”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 317-319. doi:10.18429/JACoW-IBIC2021-TUPP42

[n]	S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, “The Applications of Machine Learning in Slit Scan Emittance Measurements”, presented at the IBIC'21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished. 

For LaTeX

%\cite{Volz:IBIC21-TUPP42} \bibitem{Volz:IBIC21-TUPP42} P. I. Volz, S. Grimmer, M. Huck, and A. Meseck, \textquotedblleft{Goubau-Line Set Up for Bench Testing Impedance of IVUE32 Components}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 317--319. \doi{10.18429/JACoW-IBIC2021-TUPP42} %\cite{SMa:IBIC21-TUPP01} \bibitem{SMa:IBIC21-TUPP01} S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, \textquotedblleft{The Applications of Machine Learning in Slit Scan Emittance Measurements}\textquotedblright, presented at the IBIC’21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.

For BibTeX

@inproceedings{volz:ibic21-tupp42, author = {P. I. Volz and S. Grimmer and M. Huck and A. Meseck}, title = {{Goubau-Line Set Up for Bench Testing Impedance of IVUE32 Components}}, booktitle = {Proc. IBIC'21}, pages = {317--319}, paper = {TUPP42}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-TUPP42}, url = {https://jacow.org/ibic2021/papers/TUPP42.pdf}, language = {english} } @unpublished{sma:ibic21-tupp01, author = {S. Ma and A. Arnold and A. A. Ryzhov and J. Schaber and J. Teichert and R. Xiang}, title = {{The Applications of Machine Learning in Slit Scan Emittance Measurements}}, booktitle = {Proc. IBIC'21}, pages = {}, paper = {TUPP01}, venue = {Pohang, Korea}, intype = {presented at the}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, note = {presented at IBIC'21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished}, language = {english} }

References

• P. I. Volz, S. Grimmer, M. Huck, and A. Meseck, “Goubau-Line Set Up for Bench Testing Impedance of IVUE32 Components”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 317-319.
• S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, “The Applications of Machine Learning in Slit Scan Emittance Measurements”, presented at the 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.