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[n]	S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, “The Applications of Machine Learning in Slit Scan Emittance Measurements”, presented at the IBIC'21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.

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%\cite{SMa:IBIC21-TUPP01} \bibitem{SMa:IBIC21-TUPP01} S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, \textquotedblleft{The Applications of Machine Learning in Slit Scan Emittance Measurements}\textquotedblright, presented at the IBIC’21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.

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For BibTeX

@unpublished{sma:ibic21-tupp01, author = {S. Ma and A. Arnold and A. A. Ryzhov and J. Schaber and J. Teichert and R. Xiang}, title = {{The Applications of Machine Learning in Slit Scan Emittance Measurements}}, booktitle = {Proc. IBIC'21}, pages = {}, paper = {TUPP01}, venue = {Pohang, Korea}, intype = {presented at the}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, note = {presented at IBIC'21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished}, language = {english} }

References

S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, “The Applications of Machine Learning in Slit Scan Emittance Measurements”, presented at the 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.

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