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[n]	W. J. Schneider and D. Edwards, “Trace Impurity Analyzer”, in Proc. PAC'79, San Francisco, CA, USA, Mar. 1979, pp. 4091-4093. 
[n]	J. D. Kunz, C. M. Conrad, and L. M. Romero, “Beamline Architect”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 1812-1814. doi:10.18429/JACoW-IPAC2018-WEPAF003

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