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[n]	W. M. Sharp, J. J. Barnard, and S. S. Yu, “Transport and Error Sensitivity in a Heavy-Ion Recirculator”, in Proc. PAC'91, San Francisco, CA, USA, May 1991, pp. 260-263. 
[n]	T. Katayama, K. Ohtomo, and Y. Yuan, “Simulation of RF Stacking combined with Cooling Effects”, in Proc. EPAC'96, Sitges, Spain, Jun. 1996, paper TUP022G, pp. 1338-1340. 

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