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[n]	L. R. Dalesio, “Embedded Device Control”, in Proc. PCaPAC'08, Ljbuljana, Slovenia, Oct. 2008, paper TUY02, pp. 58-60. 

[n]	J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 283-285. doi:10.18429/JACoW-IPAC2016-MOPMR023

For LaTeX

%\cite{Dalesio:PCaPAC08-TUY02} \bibitem{Dalesio:PCaPAC08-TUY02} L. R. Dalesio, \textquotedblleft{Embedded Device Control}\textquotedblright, in \emph{Proc. PCaPAC’08}, Ljbuljana, Slovenia, Oct. 2008, paper TUY02, pp. 58--60. %\cite{Oegren:IPAC16-MOPMR023} \bibitem{Oegren:IPAC16-MOPMR023} J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, \textquotedblleft{Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope}\textquotedblright, in \emph{Proc. IPAC’16}, Busan, Korea, May 2016, pp. 283--285. \doi{10.18429/JACoW-IPAC2016-MOPMR023}

For BibTeX

@inproceedings{dalesio:pcapac08-tuy02, author = {L. R. Dalesio}, title = {{Embedded Device Control}}, booktitle = {Proc. PCaPAC'08}, pages = {58--60}, paper = {TUY02}, venue = {Ljbuljana, Slovenia, Oct. 2008}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/pc08/papers/TUY02.pdf}, language = {english} } @inproceedings{oegren:ipac16-mopmr023, author = {J. Oegren and V. G. Ziemann and S. H. M. Jafri and K. Leifer}, title = {{Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope}}, booktitle = {Proc. IPAC'16}, pages = {283--285}, paper = {MOPMR023}, venue = {Busan, Korea}, series = {International Particle Accelerator Conference}, number = {7}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {6}, year = {2016}, doi = {10.18429/JACoW-IPAC2016-MOPMR023}, url = {https://jacow.org/ipac2016/papers/MOPMR023.pdf}, language = {english} }

References

• L. R. Dalesio, “Embedded Device Control”, in Proc. 7th Int. Workshop on Personal Computers and Particle Accelerator Controls (PCaPAC'08), Ljbuljana, Slovenia, Oct. 2008, paper TUY02, pp. 58-60.
• J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 283-285.