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[n]	L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 448-450. doi:10.18429/JACoW-IBIC2018-WEPB10

[n]	D. Alesini et al., “High Power Test Results of the Eli-NP S-Band Gun Fabricated with the New Clamping Technology Without Brazing”, in Proc. IPAC'17, Copenhagen, Denmark, May 2017, pp. 3662-3665. doi:10.18429/JACoW-IPAC2017-THOBB1

For LaTeX

%\cite{Sukhikh:IBIC18-WEPB10} \bibitem{Sukhikh:IBIC18-WEPB10} L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, \textquotedblleft{Grating Scanner for Measurement of Micron-size Beam Profiles}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 448--450. \doi{10.18429/JACoW-IBIC2018-WEPB10} %\cite{Alesini:IPAC17-THOBB1} \bibitem{Alesini:IPAC17-THOBB1} D. Alesini \emph{et al.}, \textquotedblleft{High Power Test Results of the Eli-NP S-Band Gun Fabricated with the New Clamping Technology Without Brazing}\textquotedblright, in \emph{Proc. IPAC’17}, Copenhagen, Denmark, May 2017, pp. 3662--3665. \doi{10.18429/JACoW-IPAC2017-THOBB1}

For BibTeX

@inproceedings{sukhikh:ibic18-wepb10, author = {L. G. Sukhikh and G. Kube and A. Potylitsyn and S. A. Strokov and K. Wittenburg}, title = {{Grating Scanner for Measurement of Micron-size Beam Profiles}}, booktitle = {Proc. IBIC'18}, pages = {448--450}, paper = {WEPB10}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPB10}, url = {https://jacow.org/IBIC2018/papers/WEPB10.pdf}, language = {english} } @inproceedings{alesini:ipac17-thobb1, author = {D. Alesini and others}, title = {{High Power Test Results of the Eli-NP S-Band Gun Fabricated with the New Clamping Technology Without Brazing}}, booktitle = {Proc. IPAC'17}, pages = {3662--3665}, paper = {THOBB1}, venue = {Copenhagen, Denmark, May 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2017-THOBB1}, url = {https://jacow.org/ipac2017/papers/THOBB1.pdf}, language = {english} }

References

• L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 448-450.
• D. Alesini et al., “High Power Test Results of the Eli-NP S-Band Gun Fabricated with the New Clamping Technology Without Brazing”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 3662-3665.