JaCoW Logo

Reference Search

Favourites


For Word

[n]	R. Cimino and F. Sch?ñfers, “Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 2335-2337. doi:10.18429/JACoW-IPAC2014-WEPME034

For LaTeX

Use Complete Form

For BibTeX

References

Back to search