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[n]	J. I. Mann et al., “Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses”, in Proc. NAPAC'22, Albuquerque, NM, USA, Aug. 2022, pp. 535-538. doi:10.18429/JACoW-NAPAC2022-TUPA86

For LaTeX

%\cite{Mann:NAPAC22-TUPA86} \bibitem{Mann:NAPAC22-TUPA86} J. I. Mann \emph{et al.}, \textquotedblleft{Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses}\textquotedblright, in \emph{Proc. NAPAC’22}, Albuquerque, NM, USA, Aug. 2022, pp. 535--538. \url{doi:10.18429/JACoW-NAPAC2022-TUPA86}

For BibTeX

@inproceedings{mann:napac22-tupa86, author = {J. I. Mann and others}, title = {{Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses}}, booktitle = {Proc. NAPAC'22}, pages = {535--538}, paper = {TUPA86}, venue = {Albuquerque, NM, USA}, series = {North American Particle Accelerator Conference}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2022}, issn = {2673-7000}, isbn = {978-3-95-450232-5}, doi = {10.18429/JACoW-NAPAC2022-TUPA86}, url = {https://jacow.org/napac2022/papers/TUPA86.pdf}, language = {english} }

References

• J. I. Mann et al., “Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses”, in Proc. North American Particle Accelerator Conf. (NAPAC'22), Albuquerque, NM, USA, Aug. 2022, pp. 535-538.