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[n]	D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. doi:10.18429/JACoW-SRF2021-SUPFDV016

For LaTeX

%\cite{Seal:SRF21-SUPFDV016} \bibitem{Seal:SRF21-SUPFDV016} D. J. Seal \emph{et al.}, \textquotedblleft{A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. \url{doi:10.18429/JACoW-SRF2021-SUPFDV016}

For BibTeX

@inproceedings{seal:srf21-supfdv016, author = {D. J. Seal and others}, title = {{A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate}}, booktitle = {Proc. SRF'21}, pages = {100}, paper = {SUPFDV016}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-SUPFDV016}, url = {https://jacow.org/srf2021/papers/SUPFDV016.pdf}, language = {english} }

References

• D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100.