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[n]	R. M. Thurman-Keup et al., “Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 330-334. doi:10.18429/JACoW-IBIC2017-WE3AB3

[n]	S. B. Leith et al., “The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 86. doi:10.18429/JACoW-SRF2021-SUPFDV012

[n]	Y. W. Kang and X. Jiang, “Coaxial Higher-Order Mode Damper Employing a High-Pass Filter”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 2P025, pp. 2932-2934. 

[n]	D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. doi:10.18429/JACoW-SRF2021-SUPFDV016

For LaTeX

%\cite{Thurman-Keup:IBIC17-WE3AB3} \bibitem{Thurman-Keup:IBIC17-WE3AB3} R. M. Thurman-Keup \emph{et al.}, \textquotedblleft{Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 330--334. \doi{10.18429/JACoW-IBIC2017-WE3AB3} %\cite{Leith:SRF21-SUPFDV012} \bibitem{Leith:SRF21-SUPFDV012} S. B. Leith \emph{et al.}, \textquotedblleft{The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 86. \doi{10.18429/JACoW-SRF2021-SUPFDV012} %\cite{Kang:PAC97-2P025} \bibitem{Kang:PAC97-2P025} Y. W. Kang and X. Jiang, \textquotedblleft{Coaxial Higher-Order Mode Damper Employing a High-Pass Filter}\textquotedblright, in \emph{Proc. PAC’97}, Vancouver, Canada, May 1997, paper 2P025, pp. 2932--2934. %\cite{Seal:SRF21-SUPFDV016} \bibitem{Seal:SRF21-SUPFDV016} D. J. Seal \emph{et al.}, \textquotedblleft{A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. \doi{10.18429/JACoW-SRF2021-SUPFDV016}

For BibTeX

@inproceedings{thurman-keup:ibic17-we3ab3, author = {R. M. Thurman-Keup and others}, title = {{Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab}}, booktitle = {Proc. IBIC'17}, pages = {330--334}, paper = {WE3AB3}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-WE3AB3}, url = {https://jacow.org/ibic2017/papers/WE3AB3.pdf}, language = {english} } @inproceedings{leith:srf21-supfdv012, author = {S. B. Leith and others}, title = {{The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications}}, booktitle = {Proc. SRF'21}, pages = {86}, paper = {SUPFDV012}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-SUPFDV012}, url = {https://jacow.org/srf2021/papers/SUPFDV012.pdf}, language = {english} } @inproceedings{kang:pac97-2p025, author = {Y. W. Kang and X. Jiang}, title = {{Coaxial Higher-Order Mode Damper Employing a High-Pass Filter}}, booktitle = {Proc. PAC'97}, pages = {2932--2934}, paper = {2P025}, venue = {Vancouver, Canada, May 1997}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{seal:srf21-supfdv016, author = {D. J. Seal and others}, title = {{A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate}}, booktitle = {Proc. SRF'21}, pages = {100}, paper = {SUPFDV016}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-SUPFDV016}, url = {https://jacow.org/srf2021/papers/SUPFDV016.pdf}, language = {english} }

References

• R. M. Thurman-Keup et al., “Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 330-334.
• S. B. Leith et al., “The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 86.
• Y. W. Kang and X. Jiang, “Coaxial Higher-Order Mode Damper Employing a High-Pass Filter”, in Proc. 17th Particle Accelerator Conf. (PAC'97), Vancouver, Canada, May 1997, paper 2P025, pp. 2932-2934.
• D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100.