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For Word

[n]	T. E. Oseroff, M. Liepe, and Z. Sun, “Sample Test Systems for Next-Gen SRF Surfaces”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 357. doi:10.18429/JACoW-SRF2021-TUOFDV07

For LaTeX

%\cite{Oseroff:SRF21-TUOFDV07} \bibitem{Oseroff:SRF21-TUOFDV07} T. E. Oseroff, M. Liepe, and Z. Sun, \textquotedblleft{Sample Test Systems for Next-Gen SRF Surfaces}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 357. \url{doi:10.18429/JACoW-SRF2021-TUOFDV07}

For BibTeX

@inproceedings{oseroff:srf21-tuofdv07, author = {T. E. Oseroff and M. Liepe and Z. Sun}, title = {{Sample Test Systems for Next-Gen SRF Surfaces}}, booktitle = {Proc. SRF'21}, pages = {357}, paper = {TUOFDV07}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-TUOFDV07}, url = {https://jacow.org/srf2021/papers/TUOFDV07.pdf}, language = {english} }

References

• T. E. Oseroff, M. Liepe, and Z. Sun, “Sample Test Systems for Next-Gen SRF Surfaces”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 357.