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[n]	Z. Sun, M. Liepe, T. E. Oseroff, and X. Deng, “Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 662. doi:10.18429/JACoW-SRF2021-WEPTEV012

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