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[n]	I. G. Jeong et al., “Optimization of a Coherent Undulator Beamline for New Advanced Synchrotron Light Source in Korea”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 206-209. doi:10.18429/JACoW-FEL2019-TUP065

[n]	H. Maesaka et al., “Electron Beam Diagnostic System for the Japanese XFEL, SACLA”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38-46. 

For LaTeX

%\cite{Jeong:FEL19-TUP065} \bibitem{Jeong:FEL19-TUP065} I. G. Jeong \emph{et al.}, \textquotedblleft{Optimization of a Coherent Undulator Beamline for New Advanced Synchrotron Light Source in Korea}\textquotedblright, in \emph{Proc. FEL’19}, Hamburg, Germany, Aug. 2019, pp. 206--209. \doi{10.18429/JACoW-FEL2019-TUP065} %\cite{Maesaka:IBIC12-MOIC02} \bibitem{Maesaka:IBIC12-MOIC02} H. Maesaka \emph{et al.}, \textquotedblleft{Electron Beam Diagnostic System for the Japanese XFEL, SACLA}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38--46.

For BibTeX

@inproceedings{jeong:fel19-tup065, author = {I. G. Jeong and others}, title = {{Optimization of a Coherent Undulator Beamline for New Advanced Synchrotron Light Source in Korea}}, booktitle = {Proc. FEL'19}, pages = {206--209}, paper = {TUP065}, venue = {Hamburg, Germany, Aug. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-FEL2019-TUP065}, url = {https://jacow.org/fel2019/papers/TUP065.pdf}, language = {english} } @inproceedings{maesaka:ibic12-moic02, author = {H. Maesaka and others}, title = {{Electron Beam Diagnostic System for the Japanese XFEL, SACLA}}, booktitle = {Proc. IBIC'12}, pages = {38--46}, paper = {MOIC02}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/MOIC02.pdf}, language = {english} }

References

• I. G. Jeong et al., “Optimization of a Coherent Undulator Beamline for New Advanced Synchrotron Light Source in Korea”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 206-209.
• H. Maesaka et al., “Electron Beam Diagnostic System for the Japanese XFEL, SACLA”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38-46.