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[n]	H. Maesaka et al., “Electron Beam Diagnostic System for the Japanese XFEL, SACLA”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38-46. 

For LaTeX

%\cite{Maesaka:IBIC12-MOIC02} \bibitem{Maesaka:IBIC12-MOIC02} H. Maesaka \emph{et al.}, \textquotedblleft{Electron Beam Diagnostic System for the Japanese XFEL, SACLA}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38--46.

For BibTeX

@inproceedings{maesaka:ibic12-moic02, author = {H. Maesaka and others}, title = {{Electron Beam Diagnostic System for the Japanese XFEL, SACLA}}, booktitle = {Proc. IBIC'12}, pages = {38--46}, paper = {MOIC02}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/MOIC02.pdf}, language = {english} }

References

• H. Maesaka et al., “Electron Beam Diagnostic System for the Japanese XFEL, SACLA”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38-46.