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[n]	R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, “Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper MOPC20, pp. 97-100. 

For LaTeX

%\cite{Steinhagen:IBIC13-MOPC20} \bibitem{Steinhagen:IBIC13-MOPC20} R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, \textquotedblleft{Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper MOPC20, pp. 97--100.

For BibTeX

@inproceedings{steinhagen:ibic13-mopc20, author = {R. J. Steinhagen and M. J. Boland and T. G. Lucas and R. P. Rassool and T. M. Mitsuhashi}, title = {{Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics}}, booktitle = {Proc. IBIC'13}, pages = {97--100}, paper = {MOPC20}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/MOPC20.pdf}, language = {english} }

References

• R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, “Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPC20, pp. 97-100.