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[n]	F. Ewald, J. C. Biasci, L. Farvacque, and K. B. Scheidt, “Emittance Measurement Using X-Ray Lenses at the ESRF”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper WEPF11, pp. 833-836. 
[n]	X. Lu et al., “Development progress of high-level applications for the HEPS”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 4259-4261. doi:10.18429/JACoW-IPAC2023-THPA125
[n]	X. Yang et al., “Accurate prediction of mega-electron-volt electron beam properties from UED using machine learning”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 4452-4455. doi:10.18429/JACoW-IPAC2023-THPL014

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