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[n]	A. Burrill et al., “RF Measurements of the 1.6 Cell Lead/Niobium Photoinjector in HoBiCaT”, in Proc. IPAC'13, Shanghai, China, May 2013, paper WEPWO002, pp. 2313-2315. 

[n]	T. Lensch et al., “Wire Scanner Installation into the MicroTCA Environment for the European XFEL”, in Proc. IBIC'14, Monterey, CA, USA, Sep. 2014, paper MOPF13, pp. 73-76. 

For LaTeX

%\cite{Burrill:IPAC13-WEPWO002} \bibitem{Burrill:IPAC13-WEPWO002} A. Burrill \emph{et al.}, \textquotedblleft{RF Measurements of the 1.6 Cell Lead/Niobium Photoinjector in HoBiCaT}\textquotedblright, in \emph{Proc. IPAC’13}, Shanghai, China, May 2013, paper WEPWO002, pp. 2313--2315. %\cite{Lensch:IBIC14-MOPF13} \bibitem{Lensch:IBIC14-MOPF13} T. Lensch \emph{et al.}, \textquotedblleft{Wire Scanner Installation into the MicroTCA Environment for the European XFEL}\textquotedblright, in \emph{Proc. IBIC’14}, Monterey, CA, USA, Sep. 2014, paper MOPF13, pp. 73--76.

For BibTeX

@inproceedings{burrill:ipac13-wepwo002, author = {A. Burrill and others}, title = {{RF Measurements of the 1.6 Cell Lead/Niobium Photoinjector in HoBiCaT}}, booktitle = {Proc. IPAC'13}, pages = {2313--2315}, paper = {WEPWO002}, venue = {Shanghai, China, May 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2013/papers/WEPWO002.pdf}, language = {english} } @inproceedings{lensch:ibic14-mopf13, author = {T. Lensch and others}, title = {{Wire Scanner Installation into the MicroTCA Environment for the European XFEL}}, booktitle = {Proc. IBIC'14}, pages = {73--76}, paper = {MOPF13}, venue = {Monterey, CA, USA, Sep. 2014}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2014/papers/MOPF13.pdf}, language = {english} }

References

• A. Burrill et al., “RF Measurements of the 1.6 Cell Lead/Niobium Photoinjector in HoBiCaT”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper WEPWO002, pp. 2313-2315.
• T. Lensch et al., “Wire Scanner Installation into the MicroTCA Environment for the European XFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPF13, pp. 73-76.