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[n] S. Michizono, S. Anami, M. Kawamura, S. Yamaguchi, and T. Kobayashi, “Digital RF Control System for 400-MeV Proton Linac of JAERI/KEK Joint Project”, in Proc. LINAC'02, Gyeongju, Korea, Aug. 2002, paper MO462, pp. 184-186.
[n] J. Marroncle et al., “IFMIF-LIPAc Diagnostics and its Challenges”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper WECC01, pp. 557-565.
[n] R. Niemczyk et al., “Proof-of-Principle Tests for Slit-scan-based Slice Emittance Measurements at PITZ”, in Proc. LINAC'18, Beijing, China, Sep. 2018, pp. 553-556. doi:10.18429/JACoW-LINAC2018-TUPO098
[n] A. G. Afonin, V. I. Baranov, Y. A. Chesnokov, V. A. Maisheev, V. Terekhov, and I. A. Yazynin, “Use of Bent-Crystal Deflectors to Steer Beam in U-70 Accelerator of IHEP - Status and Prospects”, in Proc. RuPAC'12, Saint Petersburg, Russia, Sep. 2012, paper WEACH01, pp. 95-97.
[n] T. Lensch et al., “Wire Scanner Installation into the MicroTCA Environment for the European XFEL”, in Proc. IBIC'14, Monterey, CA, USA, Sep. 2014, paper MOPF13, pp. 73-76.
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References
- S. Michizono, S. Anami, M. Kawamura, S. Yamaguchi, and T. Kobayashi, “Digital RF Control System for 400-MeV Proton Linac of JAERI/KEK Joint Project”, in Proc. 21st Linear Accelerator Conf. (LINAC'02), Gyeongju, Korea, Aug. 2002, paper MO462, pp. 184-186.
- J. Marroncle et al., “IFMIF-LIPAc Diagnostics and its Challenges”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper WECC01, pp. 557-565.
- R. Niemczyk et al., “Proof-of-Principle Tests for Slit-scan-based Slice Emittance Measurements at PITZ”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 553-556.
- A. G. Afonin, V. I. Baranov, Y. A. Chesnokov, V. A. Maisheev, V. Terekhov, and I. A. Yazynin, “Use of Bent-Crystal Deflectors to Steer Beam in U-70 Accelerator of IHEP - Status and Prospects”, in Proc. 23rd Russian Particle Accelerator Conf. (RuPAC'12), Saint Petersburg, Russia, Sep. 2012, paper WEACH01, pp. 95-97.
- T. Lensch et al., “Wire Scanner Installation into the MicroTCA Environment for the European XFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPF13, pp. 73-76.
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