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[n]	J. C. Schuchman, J. Aloia, H. Hsieh, T. Kim, and S. Pjerov, “X-Ray Lithography Source (SXLS) Vacuum System”, in Proc. PAC'89, Chicago, IL, USA, Mar. 1989, pp. 569-571. 
[n]	H. J. You, W. I. Choo, and S. O. Jang, “Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 113-117. doi:10.18429/JACoW-IBIC2015-MOPB035

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