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[n]	A. Labanc, “Electrical axes of TESLA cavities”, in Proc. SRF'07, Beijing, China, Oct. 2007, paper WEP21, pp. XX-XX. 

[n]	C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 80-83. doi:10.18429/JACoW-IBIC2022-MOP21

For LaTeX

%\cite{Labanc:SRF07-WEP21} \bibitem{Labanc:SRF07-WEP21} A. Labanc, \textquotedblleft{Electrical axes of TESLA cavities}\textquotedblright, in \emph{Proc. SRF’07}, Beijing, China, Oct. 2007, paper WEP21, pp. XX--XX. %\cite{Thiebaux:IBIC22-MOP21} \bibitem{Thiebaux:IBIC22-MOP21} C. Thiebaux \emph{et al.}, \textquotedblleft{First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}\textquotedblright, in \emph{Proc. IBIC’22}, Kraków, Poland, Sep. 2022, pp. 80--83. \doi{10.18429/JACoW-IBIC2022-MOP21}

For BibTeX

@inproceedings{labanc:srf07-wep21, author = {A. Labanc}, title = {{Electrical axes of TESLA cavities}}, booktitle = {Proc. SRF'07}, paper = {WEP21}, venue = {Beijing, China, Oct. 2007}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/srf2007/papers/WEP21.pdf}, language = {english} } @inproceedings{thiebaux:ibic22-mop21, author = {C. Thiebaux and others}, title = {{First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}}, booktitle = {Proc. IBIC'22}, pages = {80--83}, paper = {MOP21}, venue = {Kraków, Poland}, series = {International Beam Instrumentation Conference}, number = {11}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2022}, issn = {2673-5350}, isbn = {978-3-95-450241-7}, doi = {10.18429/JACoW-IBIC2022-MOP21}, language = {english} }

References

• A. Labanc, “Electrical axes of TESLA cavities”, in Proc. 13th Int. Conf. RF Superconductivity (SRF'07), Beijing, China, Oct. 2007, paper WEP21, pp. XX-XX.
• C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 80-83.