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[n]	D. J. Scott et al., “VELA Machine Development and Beam Characterisation”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. 1752-1755. doi:10.18429/JACoW-IPAC2015-TUPJE056

[n]	C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 80-83. doi:10.18429/JACoW-IBIC2022-MOP21

For LaTeX

%\cite{Scott:IPAC15-TUPJE056} \bibitem{Scott:IPAC15-TUPJE056} D. J. Scott \emph{et al.}, \textquotedblleft{VELA Machine Development and Beam Characterisation}\textquotedblright, in \emph{Proc. IPAC’15}, Richmond, VA, USA, May 2015, pp. 1752--1755. \url{doi:10.18429/JACoW-IPAC2015-TUPJE056} %\cite{Thiebaux:IBIC22-MOP21} \bibitem{Thiebaux:IBIC22-MOP21} C. Thiebaux \emph{et al.}, \textquotedblleft{First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}\textquotedblright, in \emph{Proc. IBIC’22}, Kraków, Poland, Sep. 2022, pp. 80--83. \url{doi:10.18429/JACoW-IBIC2022-MOP21}

For BibTeX

@inproceedings{scott:ipac15-tupje056, author = {D. J. Scott and others}, title = {{VELA Machine Development and Beam Characterisation}}, booktitle = {Proc. IPAC'15}, pages = {1752--1755}, paper = {TUPJE056}, venue = {Richmond, VA, USA, May 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2015-TUPJE056}, url = {https://jacow.org/IPAC2015/papers/TUPJE056.pdf}, language = {english} } @inproceedings{thiebaux:ibic22-mop21, author = {C. Thiebaux and others}, title = {{First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}}, booktitle = {Proc. IBIC'22}, pages = {80--83}, paper = {MOP21}, venue = {Kraków, Poland}, series = {International Beam Instrumentation Conference}, number = {11}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2022}, issn = {2673-5350}, isbn = {978-3-95-450241-7}, doi = {10.18429/JACoW-IBIC2022-MOP21}, language = {english} }

References

• D. J. Scott et al., “VELA Machine Development and Beam Characterisation”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1752-1755.
• C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 80-83.