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[n]	N. Baboi, T. Hellert, L. Shi, T. Wamsat, R. M. Jones, and N. Y. Joshi, “HOM Characterization for Beam Diagnostics at the European XFEL Injector”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 616-619. doi:10.18429/JACoW-IBIC2016-WEPG03

For LaTeX

%\cite{Baboi:IBIC16-WEPG03} \bibitem{Baboi:IBIC16-WEPG03} N. Baboi, T. Hellert, L. Shi, T. Wamsat, R. M. Jones, and N. Y. Joshi, \textquotedblleft{HOM Characterization for Beam Diagnostics at the European XFEL Injector}\textquotedblright, in \emph{Proc. IBIC’16}, Barcelona, Spain, Sep. 2016, pp. 616--619. \url{doi:10.18429/JACoW-IBIC2016-WEPG03}

For BibTeX

@inproceedings{baboi:ibic16-wepg03, author = {N. Baboi and T. Hellert and L. Shi and T. Wamsat and R. M. Jones and N. Y. Joshi}, title = {{HOM Characterization for Beam Diagnostics at the European XFEL Injector}}, booktitle = {Proc. IBIC'16}, pages = {616--619}, paper = {WEPG03}, venue = {Barcelona, Spain, Sep. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2016-WEPG03}, url = {https://jacow.org/ibic2016/papers/WEPG03.pdf}, language = {english} }

References

• N. Baboi, T. Hellert, L. Shi, T. Wamsat, R. M. Jones, and N. Y. Joshi, “HOM Characterization for Beam Diagnostics at the European XFEL Injector”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 616-619.