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[n]	F. Z. Chen, L. W. Lai, Y. B. Leng, and Y. B. Yan, “Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 284-286. doi:10.18429/JACoW-IBIC2017-TUPWC03

For LaTeX

%\cite{Chen:IBIC17-TUPWC03} \bibitem{Chen:IBIC17-TUPWC03} F. Z. Chen, L. W. Lai, Y. B. Leng, and Y. B. Yan, \textquotedblleft{Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 284--286. \url{doi:10.18429/JACoW-IBIC2017-TUPWC03}

For BibTeX

@inproceedings{chen:ibic17-tupwc03, author = {F. Z. Chen and L. W. Lai and Y. B. Leng and Y. B. Yan}, title = {{Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System}}, booktitle = {Proc. IBIC'17}, pages = {284--286}, paper = {TUPWC03}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-TUPWC03}, url = {https://jacow.org/ibic2017/papers/TUPWC03.pdf}, language = {english} }

References

• F. Z. Chen, L. W. Lai, Y. B. Leng, and Y. B. Yan, “Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 284-286.