Reference Search

Favourites

For Word

[n]	B. Gao, H. J. Chen, J. Chen, Y. B. Leng, and K. R. Ye, “Beam Size Monitor Based on Multi-Silt Interferometer at SSRF”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 408-410. doi:10.18429/JACoW-IBIC2017-WEPCC21

For LaTeX

%\cite{Gao:IBIC17-WEPCC21} \bibitem{Gao:IBIC17-WEPCC21} B. Gao, H. J. Chen, J. Chen, Y. B. Leng, and K. R. Ye, \textquotedblleft{Beam Size Monitor Based on Multi-Silt Interferometer at SSRF}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 408--410. \doi{10.18429/JACoW-IBIC2017-WEPCC21}

For BibTeX

@inproceedings{gao:ibic17-wepcc21, author = {B. Gao and H. J. Chen and J. Chen and Y. B. Leng and K. R. Ye}, title = {{Beam Size Monitor Based on Multi-Silt Interferometer at SSRF}}, booktitle = {Proc. IBIC'17}, pages = {408--410}, paper = {WEPCC21}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-WEPCC21}, url = {https://jacow.org/ibic2017/papers/WEPCC21.pdf}, language = {english} }

References

• B. Gao, H. J. Chen, J. Chen, Y. B. Leng, and K. R. Ye, “Beam Size Monitor Based on Multi-Silt Interferometer at SSRF”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 408-410.