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[n]	C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844. 

For LaTeX

%\cite{Reece:LINAC10-THP038} \bibitem{Reece:LINAC10-THP038} C. E. Reece, N. Pogue, and P. M. McIntyre, \textquotedblleft{Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire}\textquotedblright, in \emph{Proc. LINAC’10}, Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842--844.

For BibTeX

@inproceedings{reece:linac10-thp038, author = {C. E. Reece and N. Pogue and P. M. McIntyre}, title = {{Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire}}, booktitle = {Proc. LINAC'10}, pages = {842--844}, paper = {THP038}, venue = {Tsukuba, Japan, Sep. 2010}, series = {Linear Accelerator Conference}, number = {25}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/LINAC2010/papers/THP038.pdf}, language = {english} }

References

• C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844.