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[n]	E. Naselli et al., “High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics”, in Proc. ECRIS'20, East Lansing, MI, USA, Sep. 2020, pp. 32-37. doi:10.18429/JACoW-ECRIS2020-MOYZO02

For LaTeX

%\cite{Naselli:ECRIS20-MOYZO02} \bibitem{Naselli:ECRIS20-MOYZO02} E. Naselli \emph{et al.}, \textquotedblleft{High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics}\textquotedblright, in \emph{Proc. ECRIS’20}, East Lansing, MI, USA, Sep. 2020, pp. 32--37. \doi{10.18429/JACoW-ECRIS2020-MOYZO02}

For BibTeX

@inproceedings{naselli:ecris20-moyzo02, author = {E. Naselli and others}, title = {{High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics}}, booktitle = {Proc. ECRIS'20}, pages = {32--37}, paper = {MOYZO02}, venue = {East Lansing, MI, USA}, series = {International Workshop on ECR Ion Sources # series}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2022}, issn = {2222-5692}, isbn = {978-3-95-450226-4}, doi = {10.18429/JACoW-ECRIS2020-MOYZO02}, url = {https://jacow.org/ecris2020/papers/moyzo02.pdf}, language = {english} }

References

• E. Naselli et al., “High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOYZO02, pp. 32-37.