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[n]	K. Sato et al., “Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components”, in Proc. ECRIS'20, East Lansing, MI, USA, Sep. 2020, pp. 125-127. doi:10.18429/JACoW-ECRIS2020-WEWZO05

For LaTeX

%\cite{Sato:ECRIS20-WEWZO05} \bibitem{Sato:ECRIS20-WEWZO05} K. Sato \emph{et al.}, \textquotedblleft{Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components}\textquotedblright, in \emph{Proc. ECRIS’20}, East Lansing, MI, USA, Sep. 2020, pp. 125--127. \url{doi:10.18429/JACoW-ECRIS2020-WEWZO05}

For BibTeX

@inproceedings{sato:ecris20-wewzo05, author = {K. Sato and others}, title = {{Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components}}, booktitle = {Proc. ECRIS'20}, pages = {125--127}, paper = {WEWZO05}, venue = {East Lansing, MI, USA}, series = {International Workshop on ECR Ion Sources # series}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2022}, issn = {2222-5692}, isbn = {978-3-95-450226-4}, doi = {10.18429/JACoW-ECRIS2020-WEWZO05}, url = {https://jacow.org/ecris2020/papers/wewzo05.pdf}, language = {english} }

References

• K. Sato et al., “Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper WEWZO05, pp. 125-127.