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[n]	G. Penn et al., “Three Unique FEL Designs for the Next Generation Light Source”, in Proc. FEL'13, New York, NY, USA, Aug. 2013, paper THOBNO01, pp. 734-739. 

[n]	T. Luo et al., “Electromagnetic bench testing of ALS upgrade beam monitor buttons and assemblies”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2365-2367. doi:10.18429/JACoW-IPAC2024-WEPG61

For LaTeX

%\cite{Penn:FEL13-THOBNO01} \bibitem{Penn:FEL13-THOBNO01} G. Penn \emph{et al.}, \textquotedblleft{Three Unique FEL Designs for the Next Generation Light Source}\textquotedblright, in \emph{Proc. FEL’13}, New York, NY, USA, Aug. 2013, paper THOBNO01, pp. 734--739. %\cite{Luo:IPAC24-WEPG61} \bibitem{Luo:IPAC24-WEPG61} T. Luo \emph{et al.}, \textquotedblleft{Electromagnetic bench testing of ALS upgrade beam monitor buttons and assemblies}\textquotedblright, in \emph{Proc. IPAC’24}, Nashville, TN, USA, May 2024, pp. 2365--2367. \doi{10.18429/JACoW-IPAC2024-WEPG61}

For BibTeX

@inproceedings{penn:fel13-thobno01, author = {G. Penn and others}, title = {{Three Unique FEL Designs for the Next Generation Light Source}}, booktitle = {Proc. FEL'13}, pages = {734--739}, paper = {THOBNO01}, venue = {New York, NY, USA, Aug. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2013/papers/THOBNO01.pdf}, language = {english} } @inproceedings{luo:ipac24-wepg61, author = {T. Luo and others}, title = {{Electromagnetic bench testing of ALS upgrade beam monitor buttons and assemblies}}, booktitle = {Proc. IPAC'24}, pages = {2365--2367}, paper = {WEPG61}, venue = {Nashville, TN, USA}, series = {International Particle Accelerator Conference}, number = {15}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2024}, issn = {2673-5490}, isbn = {978-3-95-450247-9}, doi = {10.18429/JACoW-IPAC2024-WEPG61}, language = {english} }

References

• G. Penn et al., “Three Unique FEL Designs for the Next Generation Light Source”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper THOBNO01, pp. 734-739.
• T. Luo et al., “Electromagnetic bench testing of ALS upgrade beam monitor buttons and assemblies”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPG61, pp. 2365-2367.