Favourites
For Word
[n] Z. Zhang et al., “Microbunching-Instability-Induced Sidebands in a Seeded Free-Electron Laser”, in Proc. FEL'15, Daejeon, Korea, Aug. 2015, pp. 741-745. doi:10.18429/JACoW-FEL2015-WEP084
[n] Y. Brischetto, H. Timko, and T. Argyropoulos, “High-resolution bunch profile measurements for enhanced longitudinal beam diagnostics”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2244-2247. doi:10.18429/JACoW-IPAC2024-WEPG23
[n] M. Borland et al., “High-Brightness Beams from a Light Source Injector: The Advanced Photon Source Low-Energy Undulator Test Line LINAC”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper THC19, pp. 899-901.
For LaTeX
Use Complete Form
For BibTeX
References
- Z. Zhang et al., “Microbunching-Instability-Induced Sidebands in a Seeded Free-Electron Laser”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 741-745.
- Y. Brischetto, H. Timko, and T. Argyropoulos, “High-resolution bunch profile measurements for enhanced longitudinal beam diagnostics”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPG23, pp. 2244-2247.
- M. Borland et al., “High-Brightness Beams from a Light Source Injector: The Advanced Photon Source Low-Energy Undulator Test Line LINAC”, in Proc. 20th Linear Accelerator Conf. (LINAC'00), Monterey, CA, USA, Aug. 2000, paper THC19, pp. 899-901.
Back to search