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[n]	M. Othman, “High efficiency L-band IOT design and high power testing”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper WEPS098, unpublished. 
[n]	D. R. Welch et al., “Breakdown in Pressurized RF Cavities”, in Proc. LINAC'08, Victoria, Canada, Sep.-Oct. 2008, paper THP066, pp. 945-947. 

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