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[n]	A. Lokey, “Image mapping for multiple charge state beams using a beam induced fluorescence profile monitors”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 235-237. doi:10.18429/JACoW-HIAT2025-WEP06

For LaTeX

%\cite{Lokey:HIAT25-WEP06} \bibitem{Lokey:HIAT25-WEP06} A. Lokey, \textquotedblleft{Image mapping for multiple charge state beams using a beam induced fluorescence profile monitors}\textquotedblright, in \emph{Proc. HIAT’25}, East Lansing, MI, USA, Jun. 2025, pp. 235--237. \doi{10.18429/JACoW-HIAT2025-WEP06}

For BibTeX

@inproceedings{lokey:hiat25-wep06, author = {A. Lokey}, title = {{Image mapping for multiple charge state beams using a beam induced fluorescence profile monitors}}, booktitle = {Proc. HIAT'25}, pages = {235--237}, paper = {WEP06}, venue = {East Lansing, MI, USA}, series = {International Conference on Heavy Ion Accelerator Technology}, number = {16}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2025}, issn = {2673-5547}, isbn = {978-3-95-450260-8}, doi = {10.18429/JACoW-HIAT2025-WEP06}, language = {english} }

References

• A. Lokey, “Image mapping for multiple charge state beams using a beam induced fluorescence profile monitors”, in Proc. 16th Int. Conf. on Heavy Ion Accelerator Technology (HIAT'25), East Lansing, MI, USA, Jun. 2025, paper WEP06, pp. 235-237.