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[n]	Y. Zhao et al., “HEPS beam charge measurement system”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 117-120. doi:10.18429/JACoW-IBIC2025-MOPCO22

[n]	D. Zhu, W. Zhang, Y. Sui, J. Cao, and J. Yue, “Beam profile measurement with pinhole camera and Kirkpatrick-Baez mirror at HEPS”, presented at the IBIC'25, Liverpool, UK, Sep. 2025, paper TUDC02, unpublished. 

For LaTeX

%\cite{Zhao:IBIC25-MOPCO22} \bibitem{Zhao:IBIC25-MOPCO22} Y. Zhao \emph{et al.}, \textquotedblleft{HEPS beam charge measurement system}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 117--120. \doi{10.18429/JACoW-IBIC2025-MOPCO22} %\cite{Zhu:IBIC25-TUDC02} \bibitem{Zhu:IBIC25-TUDC02} D. Zhu, W. Zhang, Y. Sui, J. Cao, and J. Yue, \textquotedblleft{Beam profile measurement with pinhole camera and Kirkpatrick-Baez mirror at HEPS}\textquotedblright, presented at the IBIC’25, Liverpool, UK, Sep. 2025, paper TUDC02, unpublished.

For BibTeX

@inproceedings{zhao:ibic25-mopco22, author = {Y. Zhao and others}, title = {{HEPS beam charge measurement system}}, booktitle = {Proc. IBIC'25}, pages = {117--120}, paper = {MOPCO22}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-MOPCO22}, language = {english} } @unpublished{zhu:ibic25-tudc02, author = {D. Zhu and W. Zhang and Y. Sui and J. Cao and J. Yue}, title = {{Beam profile measurement with pinhole camera and Kirkpatrick-Baez mirror at HEPS}}, booktitle = {Proc. IBIC'25}, pages = {}, paper = {TUDC02}, venue = {Liverpool, UK}, intype = {presented at the}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, note = {presented at IBIC'25, Liverpool, UK, Sep. 2025, paper TUDC02, unpublished}, language = {english} }

References

• Y. Zhao et al., “HEPS beam charge measurement system”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 117-120.
• D. Zhu, W. Zhang, Y. Sui, J. Cao, and J. Yue, “Beam profile measurement with pinhole camera and Kirkpatrick-Baez mirror at HEPS”, presented at the 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, paper TUDC02, unpublished.