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[n]	P. Owusu, C. Zhang, A. Bartnik, J. Maxson, and S. Karkare, “Optimizing 4D emittance measurements using the pinhole scan technique”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 543-547. doi:10.18429/JACoW-NAPAC2025-TUP075

For LaTeX

%\cite{Owusu:NAPAC25-TUP075} \bibitem{Owusu:NAPAC25-TUP075} P. Owusu, C. Zhang, A. Bartnik, J. Maxson, and S. Karkare, \textquotedblleft{Optimizing 4D emittance measurements using the pinhole scan technique}\textquotedblright, in \emph{Proc. NAPAC’25}, Sacramento, California, USA, Aug. 2025, pp. 543--547. \doi{10.18429/JACoW-NAPAC2025-TUP075}

For BibTeX

@inproceedings{owusu:napac25-tup075, author = {P. Owusu and C. Zhang and A. Bartnik and J. Maxson and S. Karkare}, title = {{Optimizing 4D emittance measurements using the pinhole scan technique}}, booktitle = {Proc. NAPAC'25}, pages = {543--547}, paper = {TUP075}, venue = {Sacramento, California, USA}, series = {North American Particle Accelerator Conference}, number = {6}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-7000}, isbn = {978-3-95-450261-5}, doi = {10.18429/JACoW-NAPAC2025-TUP075}, language = {english} }

References

• P. Owusu, C. Zhang, A. Bartnik, J. Maxson, and S. Karkare, “Optimizing 4D emittance measurements using the pinhole scan technique”, in Proc. 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, pp. 543-547.