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[n]	C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. LINAC'12, Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210-212. 

[n]	T. Junginger, W. Weingarten, R. Seviour, and C. P. Welsch, “RF and Surface Properties of Bulk Niobium and Niobium Film Samples”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper WEPPC033, pp. 2278-2280. 

[n]	M. Sapinski and T. Kroyer, “Operational Limits of Wire Scanners on LHC Beam”, in Proc. BIW'08, Lake Tahoe, CA, USA, May 2008, paper TUPTPF066, pp. 274-278. 

For LaTeX

%\cite{CXu:LINAC12-MOPB018} \bibitem{CXu:LINAC12-MOPB018} C. Xu, M. J. Kelley, and C. E. Reece, \textquotedblleft{Analyzing Surface Roughness Dependence of Linear RF Losses}\textquotedblright, in \emph{Proc. LINAC’12}, Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210--212. %\cite{Junginger:IPAC12-WEPPC033} \bibitem{Junginger:IPAC12-WEPPC033} T. Junginger, W. Weingarten, R. Seviour, and C. P. Welsch, \textquotedblleft{RF and Surface Properties of Bulk Niobium and Niobium Film Samples}\textquotedblright, in \emph{Proc. IPAC’12}, New Orleans, LA, USA, May 2012, paper WEPPC033, pp. 2278--2280. %\cite{Sapinski:BIW08-TUPTPF066} \bibitem{Sapinski:BIW08-TUPTPF066} M. Sapinski and T. Kroyer, \textquotedblleft{Operational Limits of Wire Scanners on LHC Beam}\textquotedblright, in \emph{Proc. BIW’08}, Lake Tahoe, CA, USA, May 2008, paper TUPTPF066, pp. 274--278.

For BibTeX

@inproceedings{cxu:linac12-mopb018, author = {C. Xu and M. J. Kelley and C. E. Reece}, title = {{Analyzing Surface Roughness Dependence of Linear RF Losses}}, booktitle = {Proc. LINAC'12}, pages = {210--212}, paper = {MOPB018}, venue = {Tel Aviv, Israel, Sep. 2012}, series = {Linear Accelerator Conference}, number = {26}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/LINAC2012/papers/MOPB018.pdf}, language = {english} } @inproceedings{junginger:ipac12-weppc033, author = {T. Junginger and W. Weingarten and R. Seviour and C. P. Welsch}, title = {{RF and Surface Properties of Bulk Niobium and Niobium Film Samples}}, booktitle = {Proc. IPAC'12}, pages = {2278--2280}, paper = {WEPPC033}, venue = {New Orleans, LA, USA, May 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2012/papers/WEPPC033.pdf}, language = {english} } @inproceedings{sapinski:biw08-tuptpf066, author = {M. Sapinski and T. Kroyer}, title = {{Operational Limits of Wire Scanners on LHC Beam}}, booktitle = {Proc. BIW'08}, pages = {274--278}, paper = {TUPTPF066}, venue = {Lake Tahoe, CA, USA, May 2008}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/BIW2008/papers/TUPTPF066.pdf}, language = {english} }

References

• C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210-212.
• T. Junginger, W. Weingarten, R. Seviour, and C. P. Welsch, “RF and Surface Properties of Bulk Niobium and Niobium Film Samples”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEPPC033, pp. 2278-2280.
• M. Sapinski and T. Kroyer, “Operational Limits of Wire Scanners on LHC Beam”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF066, pp. 274-278.