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[n]	G. L. Orlandi, B. Beutner, R. Ischebeck, V. Schlott, and B. Steffen, “Beam Transverse Size Effects in the OTR Spectrum as a High Resolution Diagnostic Tool”, in Proc. FEL'09, Liverpool, UK, Aug. 2009, paper MOPC62, pp. 153-156. 

[n]	P. Gessler et al., “Next Generation Electronics based on TCA for Beam-Diagnostics at FLASH and XFEL”, in Proc. DIPAC'11, Hamburg, Germany, May 2011, paper TUOB03, pp. 294-296. 

For LaTeX

%\cite{Orl:FEL09-MOPC62} \bibitem{Orl:FEL09-MOPC62} G. L. Orlandi, B. Beutner, R. Ischebeck, V. Schlott, and B. Steffen, \textquotedblleft{Beam Transverse Size Effects in the OTR Spectrum as a High Resolution Diagnostic Tool}\textquotedblright, in \emph{Proc. FEL’09}, Liverpool, UK, Aug. 2009, paper MOPC62, pp. 153--156. %\cite{Gessler:DIPAC11-TUOB03} \bibitem{Gessler:DIPAC11-TUOB03} P. Gessler \emph{et al.}, \textquotedblleft{Next Generation Electronics based on TCA for Beam-Diagnostics at FLASH and XFEL}\textquotedblright, in \emph{Proc. DIPAC’11}, Hamburg, Germany, May 2011, paper TUOB03, pp. 294--296.

For BibTeX

@inproceedings{orl:fel09-mopc62, author = {G. L. Orlandi and B. Beutner and R. Ischebeck and V. Schlott and B. Steffen}, title = {{Beam Transverse Size Effects in the OTR Spectrum as a High Resolution Diagnostic Tool}}, booktitle = {Proc. FEL'09}, pages = {153--156}, paper = {MOPC62}, venue = {Liverpool, UK, Aug. 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2009/papers/MOPC62.pdf}, language = {english} } @inproceedings{gessler:dipac11-tuob03, author = {P. Gessler and others}, title = {{Next Generation Electronics based on TCA for Beam-Diagnostics at FLASH and XFEL}}, booktitle = {Proc. DIPAC'11}, pages = {294--296}, paper = {TUOB03}, venue = {Hamburg, Germany, May 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/DIPAC2011/papers/TUOB03.pdf}, language = {english} }

References

• G. L. Orlandi, B. Beutner, R. Ischebeck, V. Schlott, and B. Steffen, “Beam Transverse Size Effects in the OTR Spectrum as a High Resolution Diagnostic Tool”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper MOPC62, pp. 153-156.
• P. Gessler et al., “Next Generation Electronics based on TCA for Beam-Diagnostics at FLASH and XFEL”, in Proc. 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11), Hamburg, Germany, May 2011, paper TUOB03, pp. 294-296.