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[n] R. Bacher, H. Edwards, and H. Weise, “The TESLA Test Facility Status Report (Oral Poster)”, in Proc. LINAC'94, Tsukuba, Japan, Aug. 1994, paper MO-17, pp. 86-88.
[n] G. Reinhold, “Pressurized 1 - MeV Electron Accelerator of the Twin -Tank Design for Electron Microscopy”, in Proc. PAC'69, Washington D.C., USA, Mar. 1969, pp. 119-124.
[n] E. J. Wall?®n, “New Designs of Short-Period Undulators for Producing High-Brightness Radiation in Synchrotron Light Sources”, in Proc. IPAC'22, Bangkok, Thailand, Jun. 2022, pp. 1624-1627. doi:10.18429/JACoW-IPAC2022-WEIYSP1
[n] G. Reinhold, H. Adler, and R. Minkner, “Electron Accelerators for Electron Microscopy in the 1 MeV Range”, in Proc. PAC'65, Washington D.C., USA, Mar. 1965, pp. 270-274.
[n] J. H. H. Lee, K.-J. Boller, T. Denis, and P. J. M. van der Slot, “The Design Of A Multi-Beam Electron Gun For A Photonic Free-Electron Laser”, in Proc. FEL'11, Shanghai, China, Aug. 2011, paper WEPB20, pp. 427-430.
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References
- R. Bacher, H. Edwards, and H. Weise, “The TESLA Test Facility Status Report (Oral Poster)”, in Proc. 1994 Linear Accelerator Conf. (LINAC'94), Tsukuba, Japan, Aug. 1994, paper MO-17, pp. 86-88.
- G. Reinhold, “Pressurized 1 - MeV Electron Accelerator of the Twin -Tank Design for Electron Microscopy”, in Proc. 3rd Particle Accelerator Conf. (PAC'69), Washington D.C., USA, Mar. 1969, pp. 119-124.
- E. J. Wall?®n, “New Designs of Short-Period Undulators for Producing High-Brightness Radiation in Synchrotron Light Sources”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 1624-1627.
- G. Reinhold, H. Adler, and R. Minkner, “Electron Accelerators for Electron Microscopy in the 1 MeV Range”, in Proc. 1st Particle Accelerator Conf. (PAC'65), Washington D.C., USA, Mar. 1965, pp. 270-274.
- J. H. H. Lee, K.-J. Boller, T. Denis, and P. J. M. van der Slot, “The Design Of A Multi-Beam Electron Gun For A Photonic Free-Electron Laser”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper WEPB20, pp. 427-430.
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