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[n]	J. X. Zhang, X. J. Bian, F. S. Chen, J. Cheng, and F. Long, “Study of Digital Quench Detection System Based on System-on-Chip Technology”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 3549-3551. doi:10.18429/JACoW-IPAC2016-THPMW008
[n]	P. Craievich et al., “High Power RF Test and Analysis of Dark Current in the SwissFEL-gun”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP049, pp. 843-846. 

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