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[n]	Y. Li, W. X. Cheng, K. Ha, and R. S. Rainer, “Transparent Lattice Characterization with Gated Turn-by-Turn Data of Diagnostic Bunch-Train”, in Proc. FLS'18, Shanghai, China, Mar. 2018, pp. 171-176. doi:10.18429/JACoW-FLS2018-THP2WB03

For LaTeX

%\cite{YLi:FLS18-THP2WB03} \bibitem{YLi:FLS18-THP2WB03} Y. Li, W. X. Cheng, K. Ha, and R. S. Rainer, \textquotedblleft{Transparent Lattice Characterization with Gated Turn-by-Turn Data of Diagnostic Bunch-Train}\textquotedblright, in \emph{Proc. FLS’18}, Shanghai, China, Mar. 2018, pp. 171--176. \url{doi:10.18429/JACoW-FLS2018-THP2WB03}

For BibTeX

@inproceedings{yli:fls18-thp2wb03, author = {Y. Li and W. X. Cheng and K. Ha and R. S. Rainer}, title = {{Transparent Lattice Characterization with Gated Turn-by-Turn Data of Diagnostic Bunch-Train}}, booktitle = {Proc. FLS'18}, pages = {171--176}, paper = {THP2WB03}, venue = {Shanghai, China, Mar. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-FLS2018-THP2WB03}, url = {https://jacow.org/fls2018/papers/THP2WB03.pdf}, language = {english} }

References

• Y. Li, W. X. Cheng, K. Ha, and R. S. Rainer, “Transparent Lattice Characterization with Gated Turn-by-Turn Data of Diagnostic Bunch-Train”, in Proc. 60th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'18), Shanghai, China, Mar. 2018, pp. 171-176.