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[n] Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, “Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 4980-4982. doi:10.18429/JACoW-IPAC2018-THPML128
[n] S. Lueders, “SUMMARY OF THE 3RD CONTROL SYSTEM CYBER-SECURITY (CS)2/HEP WORKSHOP”, in Proc. ICALEPCS'11, Grenoble, France, Oct. 2011, paper TURAULT01, pp. 603-606.
[n] L. Monaco, P. M. Michelato, C. Pagani, and D. Sertore, “On-Line Diagnostic during Cs2Te Photocathodes Formation”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper MO6RFP072, pp. 536-538.
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References
- Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, “Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4980-4982.
- S. Lueders, “SUMMARY OF THE 3RD CONTROL SYSTEM CYBER-SECURITY (CS)2/HEP WORKSHOP”, in Proc. 13th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'11), Grenoble, France, Oct. 2011, paper TURAULT01, pp. 603-606.
- L. Monaco, P. M. Michelato, C. Pagani, and D. Sertore, “On-Line Diagnostic during Cs2Te Photocathodes Formation”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper MO6RFP072, pp. 536-538.
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