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[n]	J. Wilgen and B. Beutner, “Fast Image Analysis for Beam Profile Measurement at the European XFEL”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1416-1419. doi:10.18429/JACoW-ICALEPCS2017-THPHA031

For LaTeX

%\cite{Wilgen:ICALEPCS17-THPHA031} \bibitem{Wilgen:ICALEPCS17-THPHA031} J. Wilgen and B. Beutner, \textquotedblleft{Fast Image Analysis for Beam Profile Measurement at the European XFEL}\textquotedblright, in \emph{Proc. ICALEPCS’17}, Barcelona, Spain, Oct. 2017, pp. 1416--1419. \doi{10.18429/JACoW-ICALEPCS2017-THPHA031}

For BibTeX

@inproceedings{wilgen:icalepcs17-thpha031, author = {J. Wilgen and B. Beutner}, title = {{Fast Image Analysis for Beam Profile Measurement at the European XFEL}}, booktitle = {Proc. ICALEPCS'17}, pages = {1416--1419}, paper = {THPHA031}, venue = {Barcelona, Spain, Oct. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-ICALEPCS2017-THPHA031}, url = {https://jacow.org/icalepcs2017/papers/THPHA031.pdf}, language = {english} }

References

• J. Wilgen and B. Beutner, “Fast Image Analysis for Beam Profile Measurement at the European XFEL”, in Proc. 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17), Barcelona, Spain, Oct. 2017, pp. 1416-1419.