[n] F. Becker, C. A. Andre, P. Forck, and D. Hoffmann, “Beam Induced Fluorescence (BIF) Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams”, in Proc. DIPAC'07, Venice, Italy, May 2007, paper MOO3A02, pp. 33-35.
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