[n] A. S. Aryshev, S. T. Boogert, D. F. Howell, V. Karataev, N. Terunuma, and J. Urakawa, “Sub-micrometer Resolution Transverse Electron Beam Size Measurement System based on Optical Transition Radiation”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper MOPEA052, pp. 193-195.
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