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[n]	C. E. Reece, A. D. Palczewski, and H. Tian, “A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces ÔÇô CYCLOPS”, in Proc. LINAC'12, Tel Aviv, Israel, Sep. 2012, paper MOPB062, pp. 318-320. 

For LaTeX

%\cite{Reece:LINAC12-MOPB062} \bibitem{Reece:LINAC12-MOPB062} C. E. Reece, A. D. Palczewski, and H. Tian, \textquotedblleft{A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces ÔÇô CYCLOPS}\textquotedblright, in \emph{Proc. LINAC’12}, Tel Aviv, Israel, Sep. 2012, paper MOPB062, pp. 318--320.

For BibTeX

@inproceedings{reece:linac12-mopb062, author = {C. E. Reece and A. D. Palczewski and H. Tian}, title = {{A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces ÔÇô CYCLOPS}}, booktitle = {Proc. LINAC'12}, pages = {318--320}, paper = {MOPB062}, venue = {Tel Aviv, Israel, Sep. 2012}, series = {Linear Accelerator Conference}, number = {26}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/LINAC2012/papers/MOPB062.pdf}, language = {english} }

References

• C. E. Reece, A. D. Palczewski, and H. Tian, “A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces ÔÇô CYCLOPS”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPB062, pp. 318-320.