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[n]	C. E. Reece, A. D. Palczewski, and H. Tian, “A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces ÔÇô CYCLOPS”, in Proc. LINAC'12, Tel Aviv, Israel, Sep. 2012, paper MOPB062, pp. 318-320. 
[n]	H. Tian, M. J. Kelley, C. E. Reece, and G. Ribeill, “Integrated Surface Topography Characterization of Variously Polished Niobium for Superconducting Particle Accelerators”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper WE5PFP057, pp. 2132-2134. 

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