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[n]	C. K. Sung, M. Chung, S. Hac, and Y. K. Semertzidis, “Stripline-based Non-destructive Beam Profile Monitoring System for Muon g-2/EDM Experiment at J-PARC”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 377-380. doi:10.18429/JACoW-IBIC2019-TUPP029

[n]	Y. Li et al., “In-situ Secondary Electron Yield Measurement System at CesrTA”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper TUP230, pp. 1253-1255. 

For LaTeX

%\cite{Sung:IBIC19-TUPP029} \bibitem{Sung:IBIC19-TUPP029} C. K. Sung, M. Chung, S. Hac, and Y. K. Semertzidis, \textquotedblleft{Stripline-based Non-destructive Beam Profile Monitoring System for Muon g-2/EDM Experiment at J-PARC}\textquotedblright, in \emph{Proc. IBIC’19}, Malmö, Sweden, Sep. 2019, pp. 377--380. \doi{10.18429/JACoW-IBIC2019-TUPP029} %\cite{Li:PAC11-TUP230} \bibitem{Li:PAC11-TUP230} Y. Li \emph{et al.}, \textquotedblleft{In-situ Secondary Electron Yield Measurement System at CesrTA}\textquotedblright, in \emph{Proc. PAC’11}, New York, NY, USA, Mar.-Apr. 2011, paper TUP230, pp. 1253--1255.

For BibTeX

@inproceedings{sung:ibic19-tupp029, author = {C. K. Sung and M. Chung and S. Hac and Y. K. Semertzidis}, title = {{Stripline-based Non-destructive Beam Profile Monitoring System for Muon g-2/EDM Experiment at J-PARC}}, booktitle = {Proc. IBIC'19}, pages = {377--380}, paper = {TUPP029}, venue = {Malmö, Sweden, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2019-TUPP029}, url = {https://jacow.org/ibic2019/papers/TUPP029.pdf}, language = {english} } @inproceedings{li:pac11-tup230, author = {Y. Li and others}, title = {{In-situ Secondary Electron Yield Measurement System at CesrTA}}, booktitle = {Proc. PAC'11}, pages = {1253--1255}, paper = {TUP230}, venue = {New York, NY, USA}, series = {Particle Accelerator Conference}, number = {24}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {9}, year = {2011}, url = {https://jacow.org/PAC2011/papers/TUP230.pdf}, language = {english} }

References

• C. K. Sung, M. Chung, S. Hac, and Y. K. Semertzidis, “Stripline-based Non-destructive Beam Profile Monitoring System for Muon g-2/EDM Experiment at J-PARC”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 377-380.
• Y. Li et al., “In-situ Secondary Electron Yield Measurement System at CesrTA”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper TUP230, pp. 1253-1255.