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[n]	T. Kato et al., “Design of XFEL facility in Harima”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper MOPD010, pp. 466-468. 
[n]	Y. Chu et al., “Data Acquisition and Fault Diagnostic System of Samsung Superconductor Test Facility”, in Proc. ICALEPCS'03, Gyeongju, Korea, Oct. 2003, paper MP515, pp. XX-XX. 

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