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[n]	Y. Takayama, T. Okugi, T. Miyahara, S. Kamada, J. Urakawa, and T. Naito, “Application Limit of SR Interferometer for Emittance Measurement”, in Proc. PAC'99, New York, NY, USA, Mar. 1999, paper WEA124, pp. 2155-2157. 
[n]	F. Eoz?®nou, S. Berry, J.-P. Charrier, and Y. Gasser, “More Information Concerning Electro-Polishing Mechanisms in Hydrofluoric-Sulphuric Acid Mixtures”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper THPPO069, pp. 776-780. 

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