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[n]	T. W. Debiak, “A Sweep Plate Emittance Scanner for High-Power CW Ion Beams”, in Proc. LINAC'96, Geneva, Switzerland, Aug. 1996, paper TUP48, pp. 450-452. 
[n]	K. Saito et al., “Superiority of Electropolishing over Chemical Polishing on High Gradients”, in Proc. SRF'97, Padova, Italy, Oct. 1997, paper SRF97D02, pp. 795-813. 

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