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[n] J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 283-285. doi:10.18429/JACoW-IPAC2016-MOPMR023
[n] R. Barday et al., “Field Emission Studies of Heat Treated Mo Substrates”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 2955-2957. doi:10.18429/JACoW-IPAC2014-THPRO042
[n] K. Cerff, D. Haas, J. Jakel, and M. Schmitt, “Setup and Diagnostics of Motion Control at ANKA Beamlines”, in Proc. PCaPAC'14, Karlsruhe, Germany, Oct. 2014, paper FPO018, pp. 198-200.
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References
- J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 283-285.
- R. Barday et al., “Field Emission Studies of Heat Treated Mo Substrates”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2955-2957.
- K. Cerff, D. Haas, J. Jakel, and M. Schmitt, “Setup and Diagnostics of Motion Control at ANKA Beamlines”, in Proc. 10th Int. Workshop on Personal Computers and Particle Accelerator Controls (PCaPAC'14), Karlsruhe, Germany, Oct. 2014, paper FPO018, pp. 198-200.
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