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[n]	J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 283-285. doi:10.18429/JACoW-IPAC2016-MOPMR023
[n]	R. Barday et al., “Field Emission Studies of Heat Treated Mo Substrates”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 2955-2957. doi:10.18429/JACoW-IPAC2014-THPRO042
[n]	K. Cerff, D. Haas, J. Jakel, and M. Schmitt, “Setup and Diagnostics of Motion Control at ANKA Beamlines”, in Proc. PCaPAC'14, Karlsruhe, Germany, Oct. 2014, paper FPO018, pp. 198-200. 

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