[n] N. Simos, G. Atoian, H. Ludewig, N. V. Mokhov, J. G. O, and S. N. White, “Grad-Level Radiation Damage of SiO2 Detectors”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper TH5RFP017, pp. 3479-3481.
[n] V. Kamerdzhiev, Y. Alexahin, D. N. Shatilov, V. D. Shiltsev, A. Valishev, and X. Zhang, “Experimental and Simulation Studies of Beam-Beam Compensation with Tevatron Electron Lenses”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper TUPAS024, pp. 1703-1705.
Use Complete Form