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[n] C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2097-2100. doi:10.18429/JACoW-IPAC2024-WEPC58
[n] R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 800-803.
[n] T. Gromme et al., “Slow Feedback Systems for PEP-II”, in Proc. EPAC'00, Vienna, Austria, Jun. 2000, paper WEP2A15, pp. 1897-1899.
[n] Y. C. Xu, Y. Z. Chen, K. C. Chu, L. F. Han, Y. B. Leng, and G. B. Zhao, “A New Beam Profile Diagnostic System based on the Industrial Ethernet”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper MOPE033, pp. 1044-1046.
[n] M. Boscolo et al., “Generation of a Multipulse Comb Beam and a Relative Twin Pulse FEL”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper TUPMN035, pp. 989-991.
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References
- C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPC58, pp. 2097-2100.
- R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. 2nd European Particle Accelerator Conf. (EPAC'90), Nice, France, Jun. 1990, pp. 800-803.
- T. Gromme et al., “Slow Feedback Systems for PEP-II”, in Proc. 7th European Particle Accelerator Conf. (EPAC'00), Vienna, Austria, Jun. 2000, paper WEP2A15, pp. 1897-1899.
- Y. C. Xu, Y. Z. Chen, K. C. Chu, L. F. Han, Y. B. Leng, and G. B. Zhao, “A New Beam Profile Diagnostic System based on the Industrial Ethernet”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOPE033, pp. 1044-1046.
- M. Boscolo et al., “Generation of a Multipulse Comb Beam and a Relative Twin Pulse FEL”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper TUPMN035, pp. 989-991.
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