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[n]	Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, “Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 4980-4982. doi:10.18429/JACoW-IPAC2018-THPML128
[n]	R. Ganter et al., “Peak Current Performances from Electron Sources based on Field Emission (Single Tip and Field Emitter Arrays (FEAs))”, in Proc. FEL'06, Berlin, Germany, Aug.-Sep. 2006, paper THCAU04, pp. 781-784. 

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